Preparation and Characterization of Cadmium Chalcogenide thin films by various methods: Review

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ISSN: 2349-6002 ESTD Year: 2014

UGC approved journal no 47859

Preparation and Characterization of Cadmium Chalcogenide thin films by various methods: Review
Author(s):
S Masthan Vali , Dr. B. Srinivasa Rao
Keywords:
CdX, thin films, Characterizing Techniques, preparation methods, comparison.
Abstract
In today’s community, thin films have found immense use. Thin-film research has brought several new fields forward directly or indirectly. Due to their many characteristics, thin films provide a wide scope for tiny electronics. Multilayer thin films should show much more improved characteristics compared with monolayer thin films. This article examines the manufacturing methods, benefits, and uses of thin films with several layers. Continuous technical progress in the areas of optoelectronics and photonic devices is made on multilayer thin films. Different methods may describe thin, layered films. In this paper the preparation of strong thin films using CdX [X means S, Te] with properties.
Article Details
Unique Paper ID: 153066 Publication Volume & Issue: Volume 8, Issue 5 Page(s): 378 - 382
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