Optimized Bira Technique for VLSI Processors
Author(s):
Kinda Shiva, Lali RajKumar
Keywords:
BIRA, Pseudo Random Number, VLSI
Abstract
In this paper, Built in self repair scheme(BISR) uses the built in self test(BIST) and Built in repair analysis(BIRA). BIST is used test and detect faulty memories. It send the fault information to BIRA. BIRA is used to find the repair solutions to the faulty memories. Among hiding counter measures, essentially distinguish strategies: one based on the randomisation of the execution of cryptographic algorithms one or more Pseudo Random Number Generators (PRNGs) are also included to generate the masks, which should be updated at each step of the datapath for a more efficient masking scheme. Prng used to generate key values to overcome the limitations of manual insertion values.
Article Details
Unique Paper ID: 145004

Publication Volume & Issue: Volume 4, Issue 6

Page(s): 373 - 376
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