Structural Testability Data Analysis of Synchronous Sequential Circuits

  • Unique Paper ID: 172429
  • Volume: 11
  • Issue: 8
  • PageNo: 3165-3171
  • Abstract:
  • Industries are increasingly focusing on sophisticated components for the development of multi-purpose machinery and devices, driven by the habitual integration of engineering and technology. Bounds on test sequence length can be used as a testability measure. We give a procedure to compute the upper bound on test sequence length for an arbitrary sequential circuit. We prove that the bound is exact for a certain class of circuits. Three design rules are specified to yield circuits with lower test sequence bounds.

Cite This Article

  • ISSN: 2349-6002
  • Volume: 11
  • Issue: 8
  • PageNo: 3165-3171

Structural Testability Data Analysis of Synchronous Sequential Circuits

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