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@article{144713,
        author = {G.Lahari and P.Sivakalyani},
        title = {Development of Automated Diagnostic Software to Validate for SOC-Based Hardware IPs},
        journal = {International Journal of Innovative Research in Technology},
        year = {},
        volume = {4},
        number = {2},
        pages = {316-320},
        issn = {2349-6002},
        url = {https://ijirt.org/article?manuscript=144713},
        abstract = {Diagnostic software is used in post silicon validation to validate SoC based hardware IPs automatically. Post-silicon validation has become one of the main goal in industries is to detect the bugs and remove them and also it is hard-to detect the rarely-occurring bugs that have slipped through pre-silicon verification. During the bug materialization while execution of unnatural random tests may be masked or not able to observe from the test outputs The ability to evaluate the bug-masking rate of a test provides great value in generating or effective tests are performed for high coverage deterioration by this also sometimes it is not able to find the bugs. To end this type of problems , An efficient method is to be  proposed, automated diagnostic software development that can be used in post-silicon validation to validate various SOC based hardware  IPs like, UART, DMA, IIC, GPIO, Timers and many more. Test cases are been developed by using C/C++ programming. The test cases can be executed randomly, rigorously, regressively can also be used to perform stressing especially on respective functionalities or IP features. This might help in finding the bugs at SOC IP level, hitting the every corner cases etc. And the same software can also be used across the platforms, so that development time comes down, hence reduction in production cost.},
        keywords = {post silicon verification, pre silicon validation, UART, IIC, GPIO, SPI, ARM based development board.},
        month = {},
        }