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@article{147216,
        author = {Atul Shukla and Prof Varun Brijpuria and Prof Prashant Sharma},
        title = {Review on },
        journal = {International Journal of Innovative Research in Technology},
        year = {},
        volume = {5},
        number = {6},
        pages = {79-82},
        issn = {2349-6002},
        url = {https://ijirt.org/article?manuscript=147216},
        abstract = {The extensive growth has seen in PV manufacturing industry and installed capacity of solar power plants in the last few years. Hence, the investors seek reassurance of their investments by the long-term performance of PV power plants. The performance of PV modules and balance of systems are gradually reduced with time. But, the PV module manufacturers guarantee against this power loss at 80% of nameplate Pmp after 25 years by assuming 0.5% efficiency loss per year.
The main goal of this review paper is to study of the PV module degradation under the open circuit and close circuit condition on the basis of previous research. 
},
        keywords = {Photovoltaics, Solar panel degradation, IV curve, Visual inspection, fill factor, module temperature.},
        month = {},
        }