Verification of smart contracts using Machine Learning

  • Unique Paper ID: 178977
  • PageNo: 7196-7205
  • Abstract:
  • This paper offers a machine learning approach based on behavioral analysis to identify Ethereum smart contract vulnerabilities and fraud. The Random Forest model performed better than existing tools and other ML models, with accuracy of more than 90% and high interpretability. Features such as Ether value and number of transactions were significant in the identification of risks. This method advances blockchain trust and security, with added benefits for developers, auditors, and investors.

Copyright & License

Copyright © 2026 Authors retain the copyright of this article. This article is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

BibTeX

@article{178977,
        author = {Manchala Beula Grace},
        title = {Verification of smart contracts using Machine Learning},
        journal = {International Journal of Innovative Research in Technology},
        year = {2025},
        volume = {11},
        number = {12},
        pages = {7196-7205},
        issn = {2349-6002},
        url = {https://ijirt.org/article?manuscript=178977},
        abstract = {This paper offers a machine learning approach based on behavioral analysis to identify Ethereum smart contract vulnerabilities and fraud. The Random Forest model performed better than existing tools and other ML models, with accuracy of more than 90% and high interpretability. Features such as Ether value and number of transactions were significant in the identification of risks. This method advances blockchain trust and security, with added benefits for developers, auditors, and investors.},
        keywords = {},
        month = {May},
        }

Cite This Article

Grace, M. B. (2025). Verification of smart contracts using Machine Learning. International Journal of Innovative Research in Technology (IJIRT), 11(12), 7196–7205.

Related Articles