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@article{156744,
        author = {Anam and Dr. Manju Devi},
        title = {Ultra-Low-Power and Area- Efficient Design of a Weighted Pseudorandom Test-Pattern Generator for BIST Architecture},
        journal = {International Journal of Innovative Research in Technology},
        year = {},
        volume = {9},
        number = {4},
        pages = {614-619},
        issn = {2349-6002},
        url = {https://ijirt.org/article?manuscript=156744},
        abstract = {A test pattern generator generates a pseudorandom test pattern that can be weighted to reduce the fault coverage in a built-in self-test. The objective of this paper is to propose a new weighted TPG for a scan-based BIST architecture. The motivation of this work is to generate efficient weighted patterns for enabling scan chains with reduced power consumption and area. Additionally, the pseudo-primary seed of TPG is maximized to obtain a considerable length in the weighted pseudorandom patterns. The maximum- length weighted patterns are executed by assigning separate weights to the specific scan chains using a weight-enabled clock.},
        keywords = {BIST, TPG, Genus},
        month = {},
        }