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Ultra-Low-Power and Area- Efficient Design of a Weighted Pseudorandom Test-Pattern Generator for BIST Architecture

  • Unique Paper ID: 156744
  • Volume: 9
  • Issue: 4
  • PageNo: 614-619
  • Abstract:
  • A test pattern generator generates a pseudorandom test pattern that can be weighted to reduce the fault coverage in a built-in self-test. The objective of this paper is to propose a new weighted TPG for a scan-based BIST architecture. The motivation of this work is to generate efficient weighted patterns for enabling scan chains with reduced power consumption and area. Additionally, the pseudo-primary seed of TPG is maximized to obtain a considerable length in the weighted pseudorandom patterns. The maximum- length weighted patterns are executed by assigning separate weights to the specific scan chains using a weight-enabled clock.
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Cite This Article

  • ISSN: 2349-6002
  • Volume: 9
  • Issue: 4
  • PageNo: 614-619

Ultra-Low-Power and Area- Efficient Design of a Weighted Pseudorandom Test-Pattern Generator for BIST Architecture

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