Ultra-Low-Power and Area- Efficient Design of a Weighted Pseudorandom Test-Pattern Generator for BIST Architecture
Author(s):
Anam, Dr. Manju Devi
Keywords:
BIST, TPG, Genus
Abstract
A test pattern generator generates a pseudorandom test pattern that can be weighted to reduce the fault coverage in a built-in self-test. The objective of this paper is to propose a new weighted TPG for a scan-based BIST architecture. The motivation of this work is to generate efficient weighted patterns for enabling scan chains with reduced power consumption and area. Additionally, the pseudo-primary seed of TPG is maximized to obtain a considerable length in the weighted pseudorandom patterns. The maximum- length weighted patterns are executed by assigning separate weights to the specific scan chains using a weight-enabled clock.
Article Details
Unique Paper ID: 156744

Publication Volume & Issue: Volume 9, Issue 4

Page(s): 614 - 619
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