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@article{204386,
        author = {RIHANA BANU},
        title = {SEM AND TEM ANALYSIS USING IMAGE J},
        journal = {International Journal of Innovative Research in Technology},
        year = {2026},
        volume = {13},
        number = {1},
        pages = {3104-3108},
        issn = {2349-6002},
        url = {https://ijirt.org/article?manuscript=204386},
        abstract = {This report presents the structural and morphological analysis of the synthesized materials using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). SEM was employed to examine the surface topology, grain size, and morphology, revealing detailed insights into the sample’s microstructure. TEM provided high-resolution images and diffraction patterns, enabling the investigation of internal structures, crystallinity, and lattice defects at the nanoscale. The combined SEM and TEM analyses offer a comprehensive understanding of the material characteristics, which are critical for correlating microstructural features with functional properties.},
        keywords = {SEM, TEM, Image J},
        month = {June},
        }